العربية

Research

  • Research
  • On the Reliability of Majority Gates Full Adders
Other

On the Reliability of Majority Gates Full Adders

Jan 01, 2008

DOI:

Published in: IEEE Transactions on Nanotechnology

Publisher: IEEE

Walid Ibrahim Valeriu Beiu / Mawahib Sulieman

Other Researches

Design and Simulation of a Nanoscale Threshold-Logic Multiplier

On the design of nanoscale CMOS threshold-logic adders

Low-power Reliable Nano Adders

On single-electron technology full adders

Copyright © 2024 Al Ain University. All Rights Reserved.